Used ACCRETECH / TSK UF 3000 #9314823 for sale

ACCRETECH / TSK UF 3000 Prober is a highly advanced, automated equipment, designed to provide precise measurements and data on wafers in a production environment. It is composed of a robotic manipulator, an ultrasonic microscope, a number of in-line probes, and a highly sophisticated vision system. The manipulator allows for precise movement and placement of the wafer under the microscope; the microscope provides magnified images of the wafer's surface, permitting the operator to observe the location and quantity of defects, as well as their size and shape. The in-line probes enable the operator to make measurements of the electrical characteristics of the wafer, so as to identify any potential performance issues or issues related to contamination. The unit is capable of detecting and rejecting any potential contamination related defects by scanning the wafer and identifying particles that may be as small as 0.1 microns in size. The machine can also be used to analyze the die dimensions, pitch, and other relevant characteristics in the wafer, in order to ensure that the wafer is within specifications. In addition, the tool is capable of performing post-mortem wafer testing and analysis. The asset also utilizes a sophisticated vision model in order to enable more precise measurements and mapping of the wafer's surface. The vision equipment is used to capture images of the wafer in order to detect defects as small as one third the width of a human hair. These images can then be analyzed in order to best understand the nature of the defect and to determine appropriate solutions. The entire system is designed to be controlled and monitored remotely via a web-based interface and a secure, encrypted connection. This allows the unit to be monitored, adjusted, and controlled remotely from anywhere in the world. The machine is highly customizable and can be tailored to meet the requirements of any production environment. Overall, TSK UF 3000 Prober is a highly advanced tool that enables operators to quickly and accurately identify any potential performance issues or contamination in production wafers. It is capable of scanning and measuring even the smallest defects, while providing robust data that can be used to address any issue that may arise. The asset is highly customizable and is suitable for any production environment.