Used ACCRETECH / TSK UF 3000 #9354561 for sale

ACCRETECH / TSK UF 3000 is a full-featured prober used in the semiconductor industry for inspecting and testing semiconductor components. The prober is designed to offer a broad range of analysis capabilities, including production-level probing, evaluation and fine probing, FIB cross-sectional analysis, wafer mapping, and TEM sample preparation. TSK UF 3000 is composed of multiple modules, including a sample stage, ion beam control, wafer mapping software, and wafer alignment control. The sample stage is designed for both hard and soft sample handling and comes with an optional in-stage UV light source. The wafer mapping software features an ergonomic user interface and high-speed data acquisition algorithms which allow for quick and accurate real-time mapping. The wafer alignment control includes features such as automatic level and axis alignment and compensation. The prober also includes an ion beam control module which comes with a high-precision XY drive equipment. This system features a high-capacity deflection unit, high-precision hitless XY and Z control, and a sample-on-the-fly feature which enables high-speed scanning. The ion beam can be used for deep trench imaging, cross sectioning, and layer etching. In addition, the machine also incorporates a fast-charging compensation tool for sample protection. ACCRETECH UF3000 also includes a FIB (Focused Ion Beam) cross-sectional analysis module which is designed for fine probing and high-resolution TEM sample preparation. This asset allows for a wide range of sample preparation options such as back side etching, back side stage lift off, unidirectional lift-off and thin-film etching. Finally, UF3000 prober also provides comprehensive environmental monitoring capabilities. This includes vibration detection and analysis, as well as temperature and humidity monitoring. This allows for consistent results and ensures that all measurements are performed under optimal conditions.