Used ACCRETECH / TSK UF 3000 #9357332 for sale

ACCRETECH / TSK UF 3000 Prober is a high-performance semiconductor probe test equipment designed for performing electrical testing on wafer device assemblies. The system utilizes an XYZ motion stage to position a probe card onto a wafer assembly that is mounted on the stage. The probe card is controlled by a robotic arm that moves it into position relative to the device. TSK UF 3000 features a multi-channel pattern recognition technique for precise control of the probe card position. ACCRETECH UF3000 has a very fast probe speed and maintains high accuracy even under the most demanding test conditions. The unit has a wide range of probes and accessories to meet a variety of test applications. It has a built-in fault detection and isolation capability for detecting short and open faults in any given device. Additionally, UF3000 has a built-in library of calibration and test procedures. This library contains test parameters and data which can be downloaded or uploaded directly to the machine. ACCRETECH UF 3000 has two types of electrical measurement modes. The first mode is the steady-state measurement which involves insertion of an appropriate probe into the device, capturing its voltage and current signals, and then performing time- and frequency-domain analysis and display the results of the measurements. The second mode is the transient-state measurement which is performed with a specialized probe that captures the device's voltage and current signals during different stages of its operation. After the transients have been captured, they are analyzed and displayed on the tool's LCD screen. ACCRETECH / TSK UF3000 also offers a wide range of diagnostic options including in-situ soft testing, off-wafer shallow trench isolation testing, and non-invasive visual inspection. In the soft testing mode, the probe card is used to measure electrical parameters of the device in its wafer form. Shallow trench isolation testing can detect faults inside the device that are often missed in conventional electrical tests. This type of testing is done in a non-destructive manner and requires minimal effort. Finally, non-invasive visual inspection can be used to check the structure of the device before and after its assembly. UF 3000 is designed to minimize operator intervention and maximize testing efficiency. Its probe cards are designed to maximize sample utilization and reduce test time. The asset also features automatic signal analysis and fault detection, which significantly reduce the need for manual testing. Its built-in remote control capability allows users to easily access and monitor the test model from anywhere. Additionally, it also has an expandable data management equipment to store results of the tests performed. Overall, TSK UF3000 Prober is an advanced and reliable test system capable of high-performance testing of a wide range of wafer assemblies. Its built-in features and capabilities make it an ideal testing solution for a variety of applications.