Used ACCRETECH / TSK UF 3000 #9366102 for sale

ACCRETECH / TSK UF 3000 is a prober used in the semiconductor industry that enables precise and accurate metrology measurements to inspect the quality of manufactured semiconductor wafers. It has a highly precise three-dimensional probing system and nanometer level accuracy, which provides ideal performance for a variety of tasks in a number of different industries, including semiconductor manufacturing, device, and equipment inspection. TSK UF 3000 uses a probe head that can manipulate wafers up to 8" in diameter and has a variable chuck, allowing it to accurately measure relevant physical characteristics across various materials. It is a fully automated contact-based prober that features needle-sized probes and an XY positioning stage that allows for quick, precise measurement of the sample through a variety of techniques. The scanner is capable of using optical, electrical, mechanical, and capacitive sensing, as well as traditional touch-probe tools, to produce higher resolution measurements with enhanced accuracy and significant time savings. ACCRETECH UF3000 supports high-speed positional accuracy, high precision, and high-resolution measurements, meaning it consistently produces reliable results. It can identify subtle changes on a wafer's surface and can scan a wide variety of samples. The prober also offers integrated on-site data analysis and storage, which allows users to make quality decisions faster. UF3000 is also an exceptionally safe instrument to use, featuring various safety precautions such as a protective cover, temperate maintenance feature, and integrated motion sensors. In addition, it has an in-built air cab system that isolates the sample from outside environmental changes, which helps to ensure consistent sample measurement results. By combining these safety precautions with its accuracy and on-site data analysis capabilities, UF 3000 offers users precise measurement and reliable performance.