Used ACCRETECH / TSK UF 3000 #9392313 for sale

ACCRETECH / TSK UF 3000 is a well-respected scanning electron microscope prober specifically designed for semiconductor failure analysis applications. It is a high-end, modular equipment that features a range of features and functions to efficiently and accurately diagnose and evaluate a variety of semiconductor defects. TSK UF 3000 is built with an integrated stage and is equipped with an XY theta controller, a 3-axis XYZ controller and an XYZ focus. It also features three field-effect transistors (FETs), a thermoelectrical temperature controller and a high-precision step motor. The system is capable of acquiring high-quality images and is optimized for applications that require high-resolution images. In addition, ACCRETECH UF3000 has a variety of probes and other equipment to enhance performance. These include a mechanical stubbing device, a auto-probing unit and a variety of sample utilization tools. These serve to increase productivity and reduce sample handling time. To ensure a complete analysis, there are also various software packages included with the machine. These allow operators to analyze test results and make necessary corrections. The software is intuitive and easy-to-use, allowing users to maximize their performance with minimal effort. TSK UF3000 also features a comprehensive safety package with a variety of features. These include an idle time cutoff feature which automatically shuts down the tool to prevent the accidental discharge of charged particles. There are also several interlock systems that prevent incorrect operations and ensure safe handling of samples. Overall, ACCRETECH / TSK UF3000 is a high-performance prober designed for use in semiconductor failure analysis. It is ideal for users who want a reliable, efficient analysis tool that is both precise and precise-sensing. It comes with a comprehensive safety package to prevent accidents and ensure safety, and is equipped with an array of probes and software packages for comprehensive, accurate analysis.