Used ACCRETECH / TSK UF 3000 #9407048 for sale

Manufacturer
ACCRETECH / TSK
Model
UF 3000
ID: 9407048
Vintage: 2005
Prober Missing parts 2005 vintage.
ACCRETECH / TSK UF 3000 is an advanced surface probe designed for failure analysis and quality assurance testing. This prober utilizes a scanning electro-microscope to capture images of electrical contacts, surface properties, microstructures and more. TSK UF 3000 boasts a high resolution image processor, allowing for detailed images to be displayed at magnification up to 4,000x. The probe also has an integrated, proprietary software equipment which facilitates advanced image processing functions, such as automated grain size analysis, photomicrography, 3D measurement and a range of other tools. ACCRETECH UF3000 is designed with a four-axis stage, allowing for accurate control of the X and Y coarse positioning, as well as the fine positioning of the Z-axis and an additional rotation movement. This ensures that users can precisely examine samples in a range of directions, which makes the prober suitable for analysis of irregular surfaces, surface features and non-specific areas. An integrated optical fiber coupling system makes image transfer easy, regardless of the angle or position. UF3000 can measure a range of electrical properties, thanks to its current capacity monitoring unit. These include resistance, contact resistance and conductor resistance. This allows users to accurately and quickly measure contact forces, allowing for a more comprehensive analysis of the electrical properties of a sample. TSK UF3000 also allows users to check the integrity of solder joints, thanks to its ultra-high speed voltage sampling machine, which can measure voltage as quickly as 0.3 microseconds. ACCRETECH / TSK UF3000 features a quick changeover tool, meaning that users can change imaging objectives in no time and with minimal effort. This makes the prober a versatile and reliable piece of equipment which can meet a range of testing and analysis demands. Overall, UF 3000 is an advanced prober designed for failure analysis and quality assurance testing. Its high resolution imaging processor and integrated software makes capturing detailed images and measurements a breeze, allowing for fast and accurate analysis. Its current capacity monitoring and ultra-high speed voltage sampling systems make it suitable for measuring a range of electrical properties, making this a highly-capable prober.
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