Used ACCRETECH / TSK UF 3000 #9407056 for sale

Manufacturer
ACCRETECH / TSK
Model
UF 3000
ID: 9407056
Vintage: 2005
Prober 2005 vintage.
ACCRETECH / TSK UF 3000 is an advanced probe station designed to facilitate the testing and inspection of semiconductor components. TSK UF 3000 is capable of providing electrical characterization and analysis of packaged and die-level devices, relying on its high accuracy probing solutions for making precise contact to test points on the device for measurements. ACCRETECH UF3000 features a precise motion control system, allowing for accurately scanning and positioning, which greatly increases the efficiency of the probing process. ACCRETECH / TSK UF3000 is engineered to meet high-end test requirements, allowing for testing various kinds of devices from a range of packages, such as pin-grid arrays (PGAs), ball-grid arrays (BGAs), quad flatpacks(QFPs), or leadless chip carriers (LCCs). It employs passive AC probing solutions, eliminating the need for expensive high-frequency systems, while bringing a high level of accuracy and repeatability to the measurement process. UF 3000 also offers self-correction sensing capabilities, allowing for precise feedback control and repeatable position repeatability in the micro-meter range. The device also includes low thermal impact global stage compensation that provides enhanced thermal performance and repeatability during long term probing. For maximum repeatability and accuracy, the device is equipped with an active pneumatic micro-positioner, ensuring precise and stabilized contact with the test points of the device. ACCRETECH UF 3000 also features advanced data analysis capabilities and open architecture software, enabling the user to view plotting diagrams, as well as access various data functions such as logarithmic and linear scaling. To ensure compatibility with other instruments, the probe station provides a VISA interface for a wide range of communication protocols. Overall, TSK UF3000 is an advanced prober station, designed to provide high accuracy probes for precise and repeatable testing of various semiconductor packages. Its precision motion control system, self-correction sensing, and active thermal control provide reliable and repeatable measurements, while its advanced data analysis and communication capabilities enable fast and easy access to data and results.
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