Used ACCRETECH / TSK UF 3000 #9407060 for sale

ACCRETECH / TSK UF 3000 is a prober designed for advanced analysis of semiconductor devices. This equipment offers two levels of broad functionalities: high speed and high accuracy probing for the analysis of the electrical properties of semiconductor devices. TSK UF 3000 is capable of quickly measuring the electrical parameters of semiconductor devices and chips, such as voltage, current, power, impedance, and frequency. As well, it accurately measures the characteristics of assemblies and discrete components, such as capacitance, resistance, inductance, frequency, temperature, and pressure. The UF model offers high-speed single-pin/multi-pin XYZ probing, with a world-renowned, 1 µm Z-axis resolution and precision probing capabilities. As well, it has a robust, easy-to-use interface and a wide range of customizable features, including automated board alignment and measurement coordination features. In addition, ACCRETECH UF3000 has multiple operating modes that allow for detailed analyses of device and circuit functionality. With programmability, the user can set and save an unlimited number of probe tests, making ACCRETECH UF 3000 ideal for IC development and failure analysis. UF 3000 is designed for a wide range of applications, including device characterization, high-end probing, packaging development, circuit measurements and debugging, LCD testing, embedded systems, MEMS testing and development, high frequency characterization, and embedded board testing. This prober is also a powerful platform for effective device programming and testing, as is enables easy manipulation and generation of test simulations. ACCRETECH / TSK UF3000 is a flexible, reliable platform that offers speed and precision in performing device tests and ensuring reliable test results. This prober is packed with features and capabilities that make it an ideal tool for conducting high-performance semiconductor and embedded system testing, as well as providing valuable insight into the electrical parameters of complex electronic devices.