Used ACCRETECH / TSK UF 3000 #9407066 for sale

ACCRETECH / TSK UF 3000 is a surface metrology prober with a wide range of applications in the semiconductor industry for wafer probe test and defect review. TSK UF 3000 is designed for use in a wide range of formats, and offers high accuracy, accuracy at all angles, and high-speed measurement performance. ACCRETECH UF3000 utilizes an AutoFocus laser equipment, which allows for a repeatable, accurate measurement of the surface of the sample. This system uses an auto-focus laser diode to ensure accurate, repeatable measurements regardless of the tilt angle of the sample. ACCRETECH / TSK UF3000 also includes a high-accuracy dual-end linear stage, which ensures the precision and repeatability of the measurements. The prober also has a wide range of measurement capabilities, including non-contact surface probing, microscope imaging and contact probing. UF3000 features a flexible scanning pattern and small measurement area, which enable detailed probing and imaging of the surface of the sample. This scanning unit provides fast and accurate measurements of different feature sizes. UF 3000 also features an advanced image acquisition and image processing machine, which allows for the measurement of different features such as surface roughness, micro-structure and surface defects. TSK UF3000 is also capable of measuring the thickness of films and micro-layers on the surface. ACCRETECH UF 3000 is also equipped with a micro-control unit, which allows for automated control of ACCRETECH / TSK UF 3000's measurements and functions. This allows for the automation of many tedious prober operations, and increases speed and accuracy. Overall, TSK UF 3000 is a highly user-friendly, high-accuracy and versatile prober for wafer probe tests, defect review and other surface measurements. ACCRETECH UF3000 is also highly cost-effective, making it suitable for a wide range of applications in the semiconductor industry.