Used ACCRETECH / TSK UF 3000 #9407071 for sale

ACCRETECH / TSK UF 3000 is a prober created by TSK, a semiconductor testing equipment manufacturer. It is designed to automatically test semiconductor devices, such as IC chips and MEMS. The prober can be used to enhance the efficiency of production line testing, with its precision and high speed accuracy. At its core, TSK UF 3000 prober utilizes a six-axis robot arm and a rigid base to provide its functionality. This equipment is made up of three stages, two of which are used for the robot arm and one for the base. The first stage of the robot arm is the X-axis, which moves the prober up and down. The second stage consists of the Y-axis, which moves the prober left and right. The last stage is the Z-axis, which moves the prober in and out. The base consists of a rigid platform that the robot arm is attached to and can be adjusted along the X, Y, and Z axes. The prober has a built-in vision system that uses a camera to detect changes in the device's shape and size. This vision unit helps to ensure the accuracy of test results. It also has a parametric measurement machine that uses capacitors to measure the electrical properties of the devices being tested. ACCRETECH UF3000 also includes a linear stage, which adds an extra degree of freedom to the prober. This stage is used to move the prober in and out from the device being tested, in order to make sure that the measurements are made at the proper distance. The prober is also equipped with an auto-align and align adjustment tool. This asset helps to maintain the prober's accuracy by automatically calibrating itself to match the device being tested. In addition to its versatility, ACCRETECH / TSK UF3000 also offers reliability, safety, and ease of use. It has a redundant safety model that can detect any abnormality, and can be quickly shut down in emergency situations. It also features a user-friendly interface which makes it easy to program and use. TSK UF3000 is a powerful prober that offers high accuracy and performance. It is ideal for testing a variety of semiconductor devices, such as IC chips and MEMS, and is suitable for production line testing.