Used ACCRETECH / TSK UF 3000 #9407075 for sale

ACCRETECH / TSK UF 3000 (Universal Tool Fuzer) is a compact, versatile prober designed for wafer probing and testing. It is capable of providing fine-pitch probing of up to 100um and can accommodate up to 8"wafers. The prober features a precision-machined, statically balanced base and comes with a variety of modular probes, as well as solution, care, and handling accessories to meet user requirements. TSK UF 3000 uses a combination of advanced algorithms, patented technologies, and advanced hardware design to achieve reliability at high speeds and accurate probing results. It includes patented Motion-Path Tracking (MPT) technology which helps ensure that probes respond precisely to pattern locations and accelerate and decelerate accordingly. The prober's scan-ready robotic loader is designed to take wafers from an external station to the testing chamber in a safe, efficient manner. It has a direct-drive, single-axis stage which ensures exceptional speed and accuracy of position control and a direct-drive, dual-axis gimbal for fine-pitched probing of up to hundred-micrometer wiring widths. ACCRETECH UF3000 features a modular probe equipment which is designed for special applications such as 4-wire resistance measurements and Kelvin probing. The system allows operators to quickly and easily select from their choice of probes and change over from one probe to another within a fraction of a minute. ACCRETECH / TSK UF3000 also offers a temperature-controlled testing environment for thorough wafer probing and testing. Its dual-zone temperature control maintains the wafer temperature during testing and accommodates any on-wafer temperature change due to measurement current. The unit can be configured in either a standard single-zone mode or a dual-zone mode, with the latter providing a temperature-controlled testing environment at both front and back of the wafer. In addition, UF 3000 provides users with easy-to-use software features. Its AccuStress software provides insight into layout geometry and anomalies and offers automated adjustment functions for optimizing probe settings in order to ensure repeatable measurements on multiple test sites. TSK UF3000 is an all-in-one wafer prober that can be used for dynamic probing, 4-wire probing, Kelvin probing, and other applications. Its advanced algorithms, robust hardware, and modular probe machine offer exceptional speed and accuracy, while the temperature-controlled testing environment and intuitive software make it an ideal tool for achieving accurate and reliable performance in high-speed probing applications.