Used ACCRETECH / TSK UF 3000 #9408930 for sale
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ID: 9408930
Wafer Size: 12"
Prober, 12"
Chuck material: NICKEL
Hard Disk Drive (HDD)
Floppy Disk Drive (FDD), 3.5"
Magneto optical drive
Head stage
Loader
Type: FOUP and open cassette
Dual robotic wafer transport arms
Pre-alignment stage unit
Auto needle alignment
Camera
X, Y Dual heidenhain scales
Color LCD Control panel with touch panel switches
Alarm lamp pole
Options:
Hot chuck: 30°C - 150°C
Wafer ID Recognition
Needle cleaning option: Wafer type and polish plate
Multi site parallel probing
Fail mark inspection system
Probe mark inspection system
GPIB Interface
Ethernet interface
Automatic probe card changer
Image processing board
Bump height setting
Group index
Multi pass probing
Printer
Network: Veganet
Tester and manipulator: ST MT72.
ACCRETECH / TSK UF 3000 is a prober designed for automated testing in the semiconductor industry. It is a superior, high-precision, non-contact prober that utilizes a range of optical and mechanical subsystems to provide precise, repeatable measurements. TSK UF 3000's compact design and touch-free testing capabilities make it a valuable tool for increasing throughput and improving yields in semiconductor manufacturing operations. It is able to test up to 24 different points on a single die simultaneously, making it ideal for large-scale production runs. ACCRETECH UF3000 features an x-y stage, which is used to hold, move and orient the test die. Once the die is in position, a row of lasers scans it in order to measure the test points. A powerful, integrated Vision Algorithm automatically detects defective die, ensuring accurate, reliable results. This visually-based system is powerful enough to detect defects as small as 10 microns. ACCRETECH UF 3000 also has a number of features which make it easier to use, including a user-friendly interface, intuitive diagnostics, and a comprehensive set of data output options. The interface allows the user to adjust important parameters such as sample size, test frequency, and tolerances, making it easy to customize the system for specific requirements. The built-in diagnostics provide real-time error messages and status information, helping to minimize downtime and ensure quality control. The output options allow data to be sent to a variety of devices, making it easier to review and analyze the results. Overall, UF3000 is a versatile, powerful and highly accurate prober that is an excellent choice for semiconductor testing operations. Its advanced features make it a superior option for precision testing and yield improvement.
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