Used ACCRETECH / TSK UF 3000 #9410147 for sale
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ID: 9410147
Wafer prober
Control system
Hard Disk Drive (HDD)
Floppy Disk Drive (FDD): 3-1/2"
Magneto optical drive
Head stage
Single FOUP port for 25 wafer, 8" -12"
Manual wafer inspection transfer unit
Dual robotic wafer transport arms
Per-alignment stage unit
Advanced wafer alignment unit
Dual (X and Y) Heidenhain scales
Quad pod Z stage
LED Color control panel
Touch panel switches
Alarm lamp pole (Blue / Orange / Green)
(3) Fixed trays
Inspection tray
LC40-12 Nickel cold chuck
Chiller unit: -40°C to 150°C.
ACCRETECH / TSK UF 3000 is a prober device, designed to test and measure the properties of various semiconductor materials. Using its precise optical laser-beam detection, it measures the resistances of wires and circuits, providing a highly accurate testing and measurement outcome. TSK UF 3000 utilizes a multi-directional XY scanning stage, which can be tightened or loosened to fit the exact specifications of the materials being tested. The equations and settings are adjustable to ensure precision testing and monitoring. This is further backed up by the light-weight but sturdy structure of the prober, and its ability to achieve high speeds when in operation. ACCRETECH UF3000 also features a diode bridge circuit, a built-in 16-bit ADC, and a variety of resistors and capacitors, which enables it to accurately detect resistance and dielectric properties of wires, circuits and materials. The ADC is designed to be thermally robust and allows for a wide dynamic range of measurement. The system is also equipped with high-sensitivity and adjustable probes, including Kelvin probes, pyramidal and A/XP probes, enhancing its capabilities even further. To further ensure accurate readings and results, ACCRETECH / TSK UF3000 utilizes the Heat Approximation Chromatic Transformation (HACT) algorithm and the motion estimation principle. The HACT algorithm can accurately measure temperature and resistance, even on difficult to detect materials, while the motion estimation principle significantly reduces measuring time and enables faster sample probing. Finally, TSK UF3000 is also backed up by a high-performance, low-cost PC for controlling the prober via a Windows-based program. This program allows for easy monitoring, settings adjustment, and data storage, helping users to facilitate efficient and accurate testing and measurement operations. All in all, UF 3000 is an ideal prober device for the testing and measurement of various semiconductor materials, offering precise and accurate results.
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