Used ACCRETECH / TSK UF 3000EX-e #9199412 for sale
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ID: 9199412
Vintage: 2003
Prober
With F16005EX
Nickle hot chucktop, 12"
FOUP Cassette single loader
ND3 Docking type head plate
APC: No
OCR: No
Manipulator: No
2003 vintage.
ACCRETECH / TSK UF 3000EX-e is a prober, which can be used for probing, testing, and analyzing semiconductor devices. This prober is capable of handling partial wafer or single die level probing, and it supports both manual and automatic operation. With its small footprint, it can be used in any production environment. TSK UF3000EX-E comes with several features that help to increase precision and reliability of probes. These features include a 2D alignment equipment, high precision wafer clamping system, and a wafer rotation and tilt feature. The head stage has a voice coil motor for precise and repeatable alignment, a wobble plate unit to provide increased accuracy, and an integrated needle plate and vacuum chuck to ensure accurate and stable contact with the part. It also includes a novel WID (Wide Image Deflectometry) machine that is capable of measuring the height of probes, and a damage detection tool to detect and evaluate any probe damage. ACCRETECH UF 3000 EXE also supports multiple probe card holders, allowing users to test different kinds of die without having to switch the card. This feature ensures that there will be no effect on the accuracy of the measurement, and will reduce the number of switching errors. In addition, the prober incorporates a removable needle plate that can be exchanged quickly, enabling the user to test various materials without having to replace the probe card. The prober also includes a comprehensive software suite, which includes tools for probing and analysis capabilities. This enables users to quickly view and analyze test results, as well as record trends in continuous testing systems. ACCRETECH UF 3000 EX-E also includes multiple safety features, such as a safety light curtain and an interlock asset. These features help to protect personnel from any potential hazards during testing. In addition, the prober is equipped with an alarm port that can be used to alert operators if there is any unexpected probe damage or wafer movement. Overall, ACCRETECH / TSK UF3000EX-E is a versatile and reliable prober that is designed to help reduce testing time while providing accurate and repeatable results. Its feature rich software suite and safety features make it an ideal choice for any production environment.
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