Used ACCRETECH / TSK UF 3000EX-e #9211360 for sale

ACCRETECH / TSK UF 3000EX-e automatic prober is designed for testing and inspecting wafer level devices. The prober provides precise test pattern generation, high speed wafer-level probing, and effective performance of parametric measurements. TSK UF3000EX-E can test a wide range of devices such as semiconductors, micro-electromechanical systems (MEMS), thin film transistors (TFT), thin film capacitors (TFC), and organic light emitting diodes (OLED). The prober can inspect up to 100 mm wafers at a rate of 150 segments per hour in high accuracy detection mode, allowing for quick and precise tests. ACCRETECH UF 3000 EXE can detect mid-sized to small defects through its Advanced Z-Axis Scanning System (AZS). AZS is capable of detecting large and small I/O of wafer devices, as well as bridging, floating, and absence of neighboring devices. As a result, it can detect subtle changes in signal-to-noise ratio. When conducting a test, the prober can identify problems and take corrective actions via software. The prober also supports the Remote Distribution System, which allows semiconductor engineers to operate and modify patterns using smartphones. Additionally, ACCRETECH UF 3000EX-e can conveniently share test results with various devices in a secure environment with the Real-Time Data Transfer System. TSK UF 3000EX-e prober provides accurate and efficient results while ensuring smooth operation. It has an integrated design, allowing the prober to maintain data continuity even when equipment is switched off. The prober also combines technology with advanced software, allowing it to offer enhanced reliability and repeatability in testing. Its parametric fluctuation monitoring enables users to quickly detect possible problems with their test number as it progresses. In addition, the prober features an automatic diamond probe protector that effectively prevents probe wear and tear. Moreover, the contact force sensor produces precise results, giving engineers accurate and reliable test results. UF 3000 EX-E prober is a perfect choice for any company looking for a reliable and efficient prober to conduct wafer tests at a high rate. With low maintenance requirements and robust construction, the prober can provide accurate results and ensure a smooth testing experience.