Used ACCRETECH / TSK UF 3000EX-e #9279317 for sale

ACCRETECH / TSK UF 3000EX-e is a fully automated prober specifically designed for high-capacity wafer testing. It is capable of testing and probing multiple wafer types ranging from 150mm to 300mm in size. The unit utilizes a high-precision moving stage that can travel up to 2mm/s for accurate probing and testing with minimal die shifting. The prober boasts 16-bit resolution with repeat precision of 0.5um for pinpoint accuracy. Its host-driven design gives users the flexibility to choose either an open-loop or closed-loop probing equipment, allowing for additional capabilities such as scatterometry, beam profiling, overlay profiling, and voltage contrast mapping. The unit is also designed to accommodate a wide range of probe cards and features an integrated probe card loader. The prober also includes a vision alignment system that compensates for X, Y, Z offsets, enabling optimal die placement with improved accuracy. In order to maximize performance and efficiency, TSK UF3000EX-E is equipped with a direct-drive motor unit that eliminates mechanical losses associated with rotating components. Additionally, the drive machine can accurately accelerate up to 10m/s2, allowing the wafer mapper to quickly reach its desired testing area, reducing cycle time. The prober also offers a range of capabilities suited for ATE applications such as thermal cycling, laser marking, blade pick-up, and electrical failure analysis. ACCRETECH UF 3000 EXE is also EPA-certified for optimal safety and climate control, ensuring that the unit operates within the required temperature range. Overall, UF 3000EX-e is an advanced and reliable prober that enables maximum testing throughput for wafers ranging from 150mm to 300mm in size. It features a high-precision moving stage, an integrated vision alignment tool, a host-driven design, and a variety of additional capabilities, making it the ideal choice for high-capacity wafer testing.