Used ACCRETECH / TSK UF 3000EX-HS #9360717 for sale

ACCRETECH / TSK UF 3000EX-HS is a high-end prober designed for wafer testing, Device/IC testing and printed circuit board testing. It offers a number of features and advantages. The prober utilizes a four point probe method, which provides both high accuracy and excellent reproducibility. The probe pins are made of stainless steel which enables a long life. The UF 3000EX also features a motorized XY motion stage for accurate alignment. This alignment ensures that the probe tips are precisely positioned over the device under test. TSK UF 3000EX-HS is equipped with a high speed, low noise drive system for fast probing. The drive system ensures that contact and separation are fast and smooth to ensure that any device under test is not damaged. The prober also has a high accuracy and repeatability of 3.5um +- 0.1um. This allows for excellent results when testing complex devices. ACCRETECH UF 3000EX-HS also features a large testing area. This area allows for the testing of multiple devices simultaneously, as well as easy alignment of devices. The prober can also handle a wide range of pitches from very small (100um) to large (2.5mm). Furthermore, UF 3000EX-HS supports a wide variety of probing cards, making it the perfect prober for advanced testing applications. ACCRETECH / TSK UF 3000EX-HS also comes equipped with a range of automated test functions. These functions include auto-sequence, auto-pause, auto-repeat and memory back-up. These functions allow for fast and efficient testing of devices. TSK UF 3000EX-HS is a high-end prober designed for wafer testing, Device/IC testing and printed circuit board testing. It utilizes a four point probe method for accurate alignment, as well as a high speed, low noise drive system for fast probing. It is also equipped with a large testing area, a wide range of pitches, and a variety of automated test functions. All of these features make ACCRETECH UF 3000EX-HS an excellent choice for advanced testing applications.