Used ACCRETECH / TSK UF 3000EX #293617398 for sale

ACCRETECH / TSK UF 3000EX is an advanced prober used in the semiconductor and testing industry. The prober is equipped with a four-dimensional (4D) microscope with a high-resolution UF imaging system, which provides detailed analysis of various types of semiconductor components and materials. Its advanced automated inspection technology enables users to quickly and accurately identify defects in semiconductor components, such as line/space/contact widths, overlaps, shorts, and open circuits. The prober's high speed and accuracy, combined with its excellent metrology technology and large sample sizes, are ideal for semiconductor reliability testing. The prober is capable of performing both in-line and offline testing. It is able to analyze and measure both in-die and out-die test samples. For in-die samples, the prober is capable of detecting and measuring a wide range of defects at high resolution. In addition, it is able to locate historical lot data, which can be used to improve yield and reduce device wafers. The prober also provides real-time graphical analysis, which helps reduce time and cost of debugging. The prober is equipped with a temperature-controlled Probe Card and Yield Analyzer, which provides reliable diagnostics for detecting shorts, open circuits, and other defects. The Sensor Technologies Automated Alignment System allows the prober to accurately measure samples from the wafer to the chip, providing precise results. The prober also has a 4D image processing and pattern recognition feature, which helps users identify and locate patterns quickly and accurately. TSK UF3000EX prober is designed with a variety of features and performance levels that make it a top choice for semiconductor testing. Its 4D imaging system, automated feature detection, and image processing tools provide users with the ability to quickly identify and analyze a wide range of defects. Its temperature-controlled card and analyzer provide reliable diagnostics. Finally, its sophisticated pattern recognition feature ensures that users are able to identify and locate patterns quickly and accurately.