Used ACCRETECH / TSK UF 3000EX #9123181 for sale

Manufacturer
ACCRETECH / TSK
Model
UF 3000EX
ID: 9123181
Vintage: 2007
Probers Loader unit: Left side  Barcode read: Yes USB: Yes Loader specification: 12" FOUP, 12" open, 8" open OCR: Auto wafer ID read Prober cleaning: Touch sensor Clean pad vacuum system Card change: Auto card change Chiller type: SCU-500R Test temp : -40° C ~ 150° C Chiller: Chiller(-40° C ), cooling chuck Hinge: MHF4000EXC Max multisite num: >256 dies Max cat. num: 9999 Hot / Ambient chuck 2007 vintage.
ACCRETECH / TSK UF 3000EX is an advanced precision prober designed to test and analyze the performance of microelectronic devices. It is capable of testing up to three individual dies at once, allowing for faster and more cost-effective mass production of microelectronic devices. The equipment combines high-precision probing equipment with fully automated handling and data analysis software. The probe head of TSK UF3000EX is equipped with 300µm of vertical travel and an ASIC specific probing capability. This allows for exacting contact with the device being tested and an extremely accurate positioning of the probe relative to the device's die. ACCRETECH UF 3000 EX also includes a ceramic base assembly which is generated geometrically specifically for each die in order to optimize electrical contact and minimize any potential for contamination. The prober's data acquisition system combines a combination of high-precision analog and digital components. This allows for detailed analysis of a device's parameters, including its load capacitance, gain, noise and linearity. Additionally, its graphical user interface provides simple and intuitive control over the prober, allowing for easy parameter selection and data review. ACCRETECH UF3000EX features an automated operation unit which allows for repeatable and reliable performance with minimal operator involvement. This machine accomplishes this by automatically controlling each step of the probing process, including aligning the probe with the device, connecting the probe, measuring the device's parameters, recording data and then automatically stopping the process once the specific requirements are met. Finally, ACCRETECH / TSK UF 3000 EX is also capable of delivering exceptional performance regarding the testing of memory cards. It includes built in self-test and test logging functions which allow for the automated recording of test results and the automated generation of performance-test reports. Overall, UF 3000 EX is an advanced, precision-testing and analysis platform which delivers superior performance and reliability. Through its combination of sophisticated probing equipment, automated handling and data analysis software, UF3000EX is an ideal choice for the production of high-quality microelectronic devices.
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