Used ACCRETECH / TSK UF 3000EX #9160463 for sale
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ID: 9160463
Vintage: 2007
Prober
Loader unit: Left
Barcode read: Yes
USB: Yes
Loader specification:
FOUP, 12"
Open, 8"
Open, 12"
OCR : Auto wafer ID read
Prober cleaning: Touch sensor
Clean pad vacuum system
Card change: Auto card change
Chiller type: SCU-500R
Test temperature(±1°C): -40°C ~ I50°C
Chiller: (-40°C ), Cooling chuck
Hinge: MHF4000EXC
Maximum multisite number: >256 dies
Maximum cat. number: 9999
2007 vintage.
ACCRETECH / TSK UF 3000EX is an electric prober system equipped with a line-of-sight probing station. This prober is capable of measuring numerous components and conducting perceptive analyses in several different environments, including the semiconductor industry. TSK UF3000EX has a unique set of features which make it ideal for a range of applications, including device testing, failure analysis, electrical measurements, and lithography analysis. Its programmable camera enables users to acquire images on a wide range of transistors, memories, and other devices. This camera features resolution up to 16-bit, contrast control up to 4,000:1 and an adjustable field of view. The synchronization option allows for multiple views at various angles, which is critical for accurate measurements. ACCRETECH UF 3000 EX also utilizes a differentially driven servo-mechanism which is capable of performing complex movements on the probe. The translational resolution of this system is 25 nanometers with double-axis movement and scanning speed up to 250/sec. This allows for fast and accurate probing at various distances. In addition, ACCRETECH / TSK UF3000EX has a Litho-Insight software for lithography analysis. This software provides quick and easy-to-use methods for analyzing circuit patterns of the device under test. It is capable of performing 2-dimensional image correlation and displaying results in detail that make it easier to analyze circuits and save time. Overall, TSK UF 3000 EX is a reliable and efficient prober system that is easy to operate and provides high precision. It is suitable for testing a wide range of components, conducting failure analysis and lithography analysis, and it is most commonly used in the semiconductor industry.
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