Used ACCRETECH / TSK UF 3000EX #9166353 for sale
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ID: 9166353
Vintage: 2014
Prober
Currently de-installed and warehoused
2014 vintage.
ACCRETECH / TSK UF 3000EX Prober is a semiconductor test equipment designed to evaluate the electrical properties of a wide range of semiconductor devices. The system utilizes a combination of scanning probe microscopes (SPM), micro- metrology, interferometry, and laser processing solutions, to enable the user to precisely measure and analyze semiconductor structure, composition, and electrical properties. The unit is capable of performing a variety of functions, such as high speed wafer probing, probe card testing, SPC data collection, and other advanced testing and analysis operations. The machine is equipped with an automatic wafer handling tool, which is used to transport wafers to the exchange load port. This load port enables the wafers to be exchanged in a controlled manner, without risking contamination or damage. TSK UF3000EX Prober is also equipped with a multi-function, multi-mode capability. This allows the user to define their own combination of in-loop and out-of-loop tests, such as contact analysis, electrical parameters, circuit characterization and SPC data collection. The asset also features an innovative range of software packages, which allow the user to customize their prober tests, including the ability to configure different test conditions, create customized test programs and analyze the data with ease. ACCRETECH UF 3000 EX Prober also has an integrated laser source for laser cutting and scanning. This enables the user to accurately measure, cut, pattern or scan required areas or activities on the semiconductor surface. In addition, the model is equipped with high frequency measurement capability, which facilitates tests at very high frequency signals, up to 10GHz. TSK UF 3000EX Prober is an ideal solution for semiconductor testing and measurement applications, and its combination of SPM, micro-metrology, and interferometry provides an accurate and reliable method for characterizing and evaluating a wide range of semiconductor devices. The user can also utilize the equipment to process large volumes of data quickly and effectively, while taking advantage of its integrated laser source for laser activity.
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