Used ACCRETECH / TSK UF 3000EX #9199487 for sale

ACCRETECH / TSK UF 3000EX is a prober designed for the precise analysis of integrated circuits and optoelectronic components. It is capable of probing across the full range of semiconductor device structures and is ideal for both wafer probe and package-level device testing. The prober's motorized XY table ensures accurate probing with precise, reproducible contact. The equipment's high slew rate allows precise measurements of device characteristics, even at high sweep rates. The integrated alignment magnification system reduces calibration time and ensures accuracy and repeatability. TSK UF3000EX is equipped with an eddy-current detection circuit which ensures efficient detection of the contact of probe tips to the device surface, with a high resolution 5-axis control unit for accurate and repeatable probe position adjustment. The integrated high speed, high accuracy pressure sensor enables precise control of the contact force between the probe and the device for extremely reliable measurements. The prober's ultra-fast digital data acquisition machine allows for a wide range of measurement parameters. It has an advanced user-friendly interface and a variety of test editing functions for efficient setup and analysis of devices. The tool is outputting via a wide range of communication interfaces for further process development. ACCRETECH UF 3000 EX is designed to withstand harsh factory environments and is capable of operating in controlled laboratory conditions. It features a variety of integrated safety functions to ensure safe operation, and it has an upgraded automatic calibration function to minimize downtime. Additionally, it is integrated with optional manual and automatic carrier handling systems for high-efficiency testing of large numbers of devices. ACCRETECH UF3000EX is an efficient and accurate prober solution for high speed probing of device electrical characteristics including threshold voltage, current gain, voltage gain, saturated drain current and device leakage current etc. It's superior performance and fast measurement speed make it the ideal choice for prototyping, evaluation and high-volume production testing of various device technologies.