Used ACCRETECH / TSK UF 3000EX #9243583 for sale

ACCRETECH / TSK UF 3000EX is a prober designed for testing and verifying the electrical function of semiconductor devices. It features a compact body and is able to accommodate a wide variety of device probe cards. TSK UF3000EX prober is designed for the 200mm or 300mm wafer environment, providing automated wafer probing and precise analysis testing of the devices. ACCRETECH UF 3000 EX is equipped with an advanced vision equipment to provide precise measurement and image recognition. This enables efficient measurements of various probe contact points, allowing users to accurately identify and measure device parameters. The system is also able to automatically maintain contact force, ensuring accurate results even in delicate testing environments. UF 3000EX prober is equipped with a two-dimensional vibration isolation table, which helps reduce the influence of vibration and thermal fluctuation errors, allowing for more precise accuracy. In addition, the prober is capable of wafer-level probing and tightly integrated motion control provides the exact positioning of the prober relative to the wafer, which is essential for efficient probing. ACCRETECH UF 3000EX also features an auto-clean unit designed to clear dust particles from the machine's surface, enabling consistently accurate results. The prober has an integrated optimization tool which can adjust the input signal, and a DSP-based asset for data acquisition, filtration and analysis. Furthermore, ACCRETECH / TSK UF 3000 EX prober is compliant with the SEMI standards for semiconductor device testing, ensuring users are able to obtain efficient device testing. The prober also has an interface for data exchange with ATE systems, allowing users to use the prober as part of their automated test process. Finally, the prober is able to provide highly accurate measurements and data management capabilities, allowing users to accurately analyze device performance.