Used ACCRETECH / TSK UF 3000EX #9253250 for sale
URL successfully copied!
ID: 9253250
Vintage: 2007
Probers
With ARTS W3 Chiller
Manipulator: MHF9000EX
Loader: Front1 left
No fail mark inspection
Needle inspection
Auto needle alignment
Auto needle height setting
No off site marking
Auto card changer: APC
Camera oblique + Coaxial
TH Clamp
High rigidity chuck
No RS232
GP-IB
No driver marker
Cleaning unit:
Pedestal: Large
No plate
Hot / Cold chuck temperature: -190°
No internal printer
No external printer
OCR
SACC Cart
Linear scale
No TTL
No RF-TAG
Tilting
2007 vintage.
ACCRETECH / TSK UF 3000EX is a prober designed for macro to sub-micron level probing and measurement testing. TSK UF3000EX is perfect for failure analysis, device and system testing, material properties analysis, non-contact process control and more. ACCRETECH UF 3000 EX has a very small, compact design which makes it ideal for use in tight spaces, laboratories, production lines and other areas where precision is key and space is limited. The prober is capable of probing at depths ranging from 0.03 to 30 mm, allowing for incredibly detailed analysis within a small area. ACCRETECH UF3000EX features high-resolution optics and a laser beam scanning system that can precisely measure even the most minuscule of features. With a maximum probing area of 650 mm x 650 mm, UF 3000 EX is perfect for identifying defects on even larger-scale parts and systems. The prober also comes equipped with automatic microscope height compensation, allowing the user to quickly and easily take precise measurements without needing to manually adjust the microscope's settings. ACCRETECH UF 3000EX has a maximum X-Y resolution of 10 nm, with a Y-axis resolution of up to 1 micron. UF 3000EX offers automated focus control and a variety of user-friendly controls, making it extremely user friendly. The prober also features an ergonomic interface, allowing users to easily program their tests on the computer and load their programs and settings into the prober. ACCRETECH / TSK UF 3000 EX also comes with an integrated image processing and analysis software package, allowing for easy data analysis and management. The software can be used to automatically detect, count, label and measure features and defects on given components and systems. Overall, TSK UF 3000EX is a top-of-the-line prober for macro to sub-micron level testing, measurement and analysis. Its small size and incredibly powerful features make it perfect for use in tight spaces or on production lines. Its automated focus control, detailed microscope calculation and integrated software make it an invaluable tool for any engineer or technician looking for the highest level of accuracy and detail in their testing.
There are no reviews yet