Used ACCRETECH / TSK UF 3000EX #9258199 for sale

ACCRETECH / TSK UF 3000EX is a prober that provides advanced probing capabilities for off-the-shelf integrated circuit (IC) components. This tool is used to assess the performance of the IC components to meet their expected silicon performance. With its micro-positioning accuracy, TSK UF3000EX helps semiconductor test engineers pinpoint critical performance issues quickly, reliably, and effectively. ACCRETECH UF 3000 EX's small footprint and slim design provide superior convenience when it comes to being mounted on a production line. The prober's user-friendly design also makes it easy to use and navigate. Its intuitive menu structure and graphical user interface (GUI) enable semiconductor test engineers to configure easily their test parameters and quickly sample ICs. ACCRETECH UF 3000EX offers superior performance and reliability, thanks to its high performance probing technology. Its robust and reliable design makes it well suited for real-time probing applications, such as probing densely packaged ICs. Thanks to its multiple-points measurements technology, users can easily probe large-scale ICs with complex designs with only one test setup. In addition to its accuracy and reliability, UF3000EX also is designed for flexibility. Its modular design enables users to quickly and easily change its test configurations to accommodate different IC designs. Furthermore, its standard mechanical interfaces enable users to quickly and easily connect different instruments and PC's, such as pressure gauges, thermocouples and oscilloscopes. In conclusion, TSK UF 3000 EX is a versatile and reliable prober that offers exceptional performance and flexibility for probing off-the-shelf IC components. Its high-accuracy micro-positioning capabilities, combined with its user-friendly design, enable semiconductor test engineers to quickly and easily pinpoint critical performance issues with IC components. Furthermore, its modular design and standard mechanical interfaces provide users the ability to quickly and easily configure their test setups to accommodate different IC designs.