Used ACCRETECH / TSK UF 3000LX #9196125 for sale

ACCRETECH / TSK UF 3000LX prober is a highly precise and reliable system designed for the probing of semiconductor wafers. The prober features a compact footprint along with motorized X, Y, Z translations to enable highly accurate and repeatable automated probing. It also features an advanced scanning mirror system for improved overall performance. The prober is capable of handling wafers up to 200mm in diameter and is able to handle many different types of wafers including Si, SiGe, and SiC. The intuitive user interface allows for easy set-up and adjustment of the prober's parameters. Users are able to customize the prober's settings to best suit the particular application, making it ideal for a wide range of test applications. The prober is equipped with a high-precision motorized X, Y, and Z motion stages, allowing for highly accurate and repeatable automated probing of wafers. The Z-axis release force is adjustable for optimum wafer clamping, while the prober is also able to quickly execute automated movements in order to avoid any sampling errors. The prober also features an advanced scanning mirror system which provides high resolution image data and effectively eliminates the adverse effects of vibration and thermal gradients. Furthermore, the prober has a powerful software module which allows for automatic wafer processing to provide users with important information such as leakage path analysis, die-based defect analysis, and substrate binning. TSK UF 3000LX prober is designed to be highly reliable and compatible with various types of high-end automatic inspection systems. The prober is also equipped with an anti-deflection window for reliable inspection of wafers even under various temperatures and humidity. With its advanced features, rapid processing speeds, and excellent accuracy, ACCRETECH UF3000LX prober is the ideal choice for any production environment.