Used ACCRETECH / TSK UF 3000LX #9223028 for sale

ACCRETECH / TSK UF 3000LX is a prober specifically designed for wafer probing applications. This prober is suitable for use in semiconductor testing, materials testing, equipment validation, device characterization, or fabrication lot qualification processes. The unit is a vertical-axis prober, which offers the longest and most stable probing platform on the market. TSK UF 3000LX enables users to perform higher probing pressures and contact forces for greater vertical accuracy in a very small footprint. With its solid structure and stable operation, this prober results in higher yield with fewer rejections. The prober is equipped with a data acquisition system, enabling it to be used for probing a wide range of materials such as silicon, SOI, MEMS, bonding and packaging. The unit features two stages of probe movement with a built-in adjustable range of up to ±1 mm (default). This prober also features an additional stage of Z-axis motion. ACCRETECH UF3000LX is equipped with a closed-loop control mechanism that allows the tool to automatically correct for its settling time. The prober utilizes a high-precision DC motor to achieve a stable three-axis moving mechanism. It also features a water circulating unit, air cooling dissipation and an air jet machine for a more efficient cooling of the adjustable probes. In addition to the two stages of movement and Z-axis motion, TSK UF3000LX also features a vision tool. The vision asset allows the user to check before and after sampling, with the assistance of a high resolution camera for accurate inspection of the sample. This prober is also equipped with a touch screen and 200MHz Micro TSK DSP controller with Ethernet connectivity. The DSP is able to communicate with a host PC as well as with test equipment and tester systems, allowing users to integrate ACCRETECH UF 3000LX into existing test processes. UF 3000LX also has an automated calibration feature. This feature ensures that during each measurement, the individual probe elements are properly aligned and suspended in order to accurately interact with the sample surface. UF3000LX is the perfect solution for wafer probing applications, due to its robust structure and advanced features. Its high precision and stability makes it easy to use and ensures reliable, accurate measurement results.