Used ACCRETECH / TSK UF 300A #9021582 for sale

ACCRETECH / TSK UF 300A is an automated prober, designed for automated testing of semiconductor devices and materials. TSK UF300A is a modular system, allowing for a variety of configurations. The prober is designed for testing of wafers up to 300mm in diameter and features a large working area for the testing platforms. ACCRETECH UF-300A features high accuracy, speed, and repeatability for reliable, efficient testing. TSK UF 300A is capable of high precision measurement of up to 4 points of a wafer at the same time, and features high speed wafer transfer for efficient testing of high density wafers. TSK UF 300 A is equipped with an auto-focusing CCD camera for automatic alignment of test boards and measuring caps during testing. Additionally, the prober is designed with a number of safety features, such as an automatic E-stop, pressure sensors, and over temperature protection. ACCRETECH / TSK UF300A is well suited for applications such as wafer non-destructive testing, failure analysis, and electrical performance evaluations. It is equipped with two measuring boards, a prober tool, and up to three non-contact probes. The two measuring boards provide a wide range of tasks such as voltage, current, resistance and capacitance measurements, as well as contact testing, capacitive touch measurements, and more. The three non-contact probes allow for high speed, non-destructive testing of critical functions in tests such as AC leakage, dielectric breakdown, and contact-LPM testing. ACCRETECH UF300A is designed for use in R&D and production testing applications, and is compatible with a variety of wafer cleaners, etching machines, and other equipment. ACCRETECH / TSK UF-300A features a version of TSK vTester operating software, enabling users to create and run their own testing procedures. Additionally, the software is equipped with a data monitor which displays real-time test results, simplifying testing and troubleshooting. ACCRETECH / TSK UF 300 A prober is an automated system designed for efficient testing of semiconductor devices. It features high accuracy, speed, and repeatability, as well as a number of safety features and a wide range of test boards and non-contact probes. The software also allows for easy creation and running of user-defined testing procedures, as well as a data monitor for real-time display of test results. UF300A is well suited for various R&D and production testing applications.