Used ACCRETECH / TSK UF 300A #9189902 for sale

ACCRETECH / TSK UF 300A is an advanced prober equipment designed for the testing and measurement of semiconductor samples. The system offers an enhanced degree of accuracy and reliability for the testing of transistors and integrated circuits (ICs). TSK UF300A utilizes an Alpha-Numerical Controller (ANC) for improved control and measurement accuracy. It is equipped with an 8-inch color LCD monitor, providing a visual guide to the prober's operations. ACCRETECH UF-300A is also equipped with a Data Analysis Interface (DAI) to enable data analysis and interactive device test with complex samples. ACCRETECH UF300A is designed with a High Palatial Residency (HPR) which is capable of producing automated test conditions to allow probing of both small and large scales samples. It is also equipped with an in-built vacuum chuck to secure the sample in place, preventing movement during probing and ensuring optimal testing resolution. UF300A offers an optimized probing area of 522.5 x 298 mm, achieving a maximum coordinates resolution of 0.25 um. The accuracy of UF 300A is ensured by its Minimized Thermal Path (MTP) feature. This feature helps to maintain a constant temperature during testing and measuring, thereby reducing signal drift and noise from the unit. Furthermore, UF-300A offers a Contactless Probing mechanism, which allows testing of non-conductive samples up to a height of 50 mm without applying a probe force. This reduces the risk of damaging the sample being tested, due to contact or mechanical forces. The machine is also equipped with a Query Short Laser beam and Back Scatter Auto Focus capabilities to improve the accuracy of contactless probing. TSK UF-300A features a software package that is geared towards automation and ease of use. It is programmed with an array of algorithms meant to facilitate testing and measurement processes. Additionally, it supports multiple programming languages including Visual Basic, C# and LabVIEW, offering flexibility for automation. UF 300 A is a highly efficient and advanced prober tool for testing and measuring of a wide range of semiconductor samples. It offers improved control, accuracy, and reliability for a variety of testing purposes.