Used ACCRETECH / TSK UF 300A #9211362 for sale

ACCRETECH / TSK UF 300A
Manufacturer
ACCRETECH / TSK
Model
UF 300A
ID: 9211362
Vintage: 2001
Prober 2001 vintage.
ACCRETECH / TSK UF 300A is a high-performance prober designed for the precision and accuracy of wafer probing. It features a modular and compact design, along with a three-axis motorized stage, capable of providing precise sampling results. TSK UF300A is capable of high-speed probing up to 1GHz and 4GHz, and can perform both contactless and contact testing. The prober offers an increased probing force of up to 5000gf, which allows the device to accurately capture measurements from the test object. This increased force is enabled by the prober's advanced two-stage force compensation. The device additionally features a high-performance controller, as well as an integrated probing solution that combines software and hardware, to ensure efficient and accurate probing operations. The prober is equipped with a touch screen display and a variety of indicators, buttons, and functions, including wafer mapping and optical zoom. Its touch screen features a graphical user interface (GUI) system, enabling the user to quickly and easily operate ACCRETECH UF-300A without learning a difficult or cumbersome command language. The device is able to examine various test shapes, including notched rectangles, printed circles, and micrometer patterns. The prober is constructed with a single-shell stainless steel housing, which helps promote a more lightweight and efficient design, as well as greater corrosion resistance. UF300A is also temperature-controlled, and is capable of monitoring the actual temperature in the area of prodding. This helps reduce the risk of thermal runaways, in addition to minimizing any damage to the wafer surface. The prober's six-axis controller is dedicated to controlling and accurately setting the probing force. It is capable of precisely reading, measuring, and controlling the test parameters, which helps increase testing accuracy and reliability. Additionally, UF-300A features dual laser probing, and is able to detect the position of both sides of the test object simultaneously. Its dual-sensing probe help improve the accuracy and speed of probing, by exactly controlling one probe's height difference from the other. Overall, ACCRETECH UF300A is a high-performance prober designed for accurate and precise wafer probing. The device features a variety of features, including a touchscreen, high-speed probing, advanced force compensation, dual laser probe, and more. As such, customers can rest assured that they're receiving a robust and reliable prober which will provide repeatable and accurate testing results every time.
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