Used ACCRETECH / TSK UF 300A #9363119 for sale

ACCRETECH / TSK UF 300A
Manufacturer
ACCRETECH / TSK
Model
UF 300A
ID: 9363119
Vintage: 2001
Wafer prober 2001 vintage.
ACCRETECH / TSK UF 300A is a prober which is used to accurately measure and analyze the characteristics of various pieces of semiconductor components. It is a fully automated unit allowing operators to quickly and accurately perform a wide variety of tests on different sizes and types of integrated circuits. This prober allows test samples and data to be collected with a high degree of accuracy and precision. This unit is also capable of measuring and analyzing defects in complex, smaller-scale integrated circuits that are not able to be probed with other probers. Additionally, the testing process can be done at low voltages and current levels, eliminating many of the risks associated with high-voltage tests. The prober is capable of measuring and analyzing surface electrical resistance, which is often critical for identifying defective ICs. Additionally, this unit allows for the measurement of contact resistance and piezoresistive deformation measurements, as well as capacitance, inductance, and even real-time waveform verification. This unit is designed for both wafer-level and device-level physical characterization and test. Furthermore, TSK UF300A is equipped with either a high- or low-temperature test chamber, depending on the sample types and testing requirements. This is suitable for various types of test requirements, including the measurement of electrical, thermal, mechanical, and magnetic properties of high-density and low-power-consumption devices. In addition, ACCRETECH UF-300A is equipped with a list of features such as a database lookup, in-room library, available database creation and supplement, and even an automatic database search. Furthermore, its simple setup and intuitive operation system are designed to enable easy data acquisition from the prober's built-in database. Overall, UF 300 A is a highly versatile prober designed for the measurement and analysis of both wafer-level and device-level physical properties. This prober is ideal for testing integrated circuits as it makes accurate measurements and is capable of performing a variety of tests at low current levels and temperatures. Furthermore, its database capabilities and intuitive operating system make it easy to use and further improve its efficiency and accuracy.
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