Used ACCRETECH / TSK UF 60 #9226940 for sale

ACCRETECH / TSK UF 60 is a prober designed for testing and characterization of wafers with a small diameter of up to 3 inches. This prober features a high resolution displacement optical encoder, providing accurate repeatability and high-precision scanning. The prober is capable of probing up to 100 probes simultaneously while offering up to 4x magnification and a maximum probing speed of 20μm/s. TSK UF 60 also features an auto-focus, LED lighting, digital zoom, and a dedicated tilted work surface that can be easily adjusted. ACCRETECH UF 60 is able to accommodate any wafer of up to 3 inches in diameter or alternatively, a Semiconductor Standard Assembly (SSA). This prober is designed for non-contact scanning, making it ideal for high speed and low force scanning. In addition, it is capable of performing high-resolution scans at the nanometer level. Moreover, the prober is designed to be user friendly, providing a graphical user interface (GUI) with a touch-screen operation system. UF 60 has been designed with an extremely rugged construction, allowing precise probing in both angle and height. The prober is has been designed so that it can be easily integrated with any automated wafer probing system. Additionally, if needed, the prober can be operated in a fully automatic mode for fast testing, allowing up to 50 probes per second. ACCRETECH / TSK UF 60 has a robust operability, and is able to work in a wide range of temperature extremes, providing reliable long-term operation. Furthermore, the optional X-Y stage enables multiple arrays with one prober, improving testing capacity and precision. TSK UF 60 has a pre-set calibration that eliminates time-consuming manual calibrations, as well as offering a customizable alignment process. Overall, ACCRETECH UF 60 prober is a top-notch wafer-testing machine that is reliable and precise. With its multifunctional features, user-friendly GUI, and robust operability, it provides users with a comprehensive and easy to use solution for wafer testing and characterization.