Used ACCULOGIC Sprint 4510 #293819760 for sale

ACCULOGIC Sprint 4510
Manufacturer
ACCULOGIC
Model
Sprint 4510
ID: 293819760
Vintage: 2016
Flying probe tester 2016 vintage.
ACCULOGIC Sprint 4510 is a powerful and versatile prober designed for semiconductor testing and applications requiring probing and automated probing. Sprint 4510 offers a wide range of probes and accessories to accommodate a variety of probing technologies such as single-layer, standard, and 5-point probing. The prober features a high-speed X-Y positioning equipment that provides fast, accurate, and repeatable measurements. The system includes a built-in three-axis high-precision linear autocollimator, an embedded PC with an intuitive user interface, and a high-resolution camera for providing probeTips views for programming and review. It has a large screen display for easy viewing and an integrated calibration unit which helps to ensure best-in-class repeatability and accuracy. ACCULOGIC Sprint 4510 is designed to be ultra-precise and can guarantee an accuracy of 1.5 µm and a repeatability of 0.3 µm. It also exceeds the stringent accuracy requirements of the automated test industry and is suitable for a range of testing needs such as electronic board testing, IC testing, microelectronics probing, and junctions mark analysis. The prober offers several valuable features including an X-Y staging, a wide range of probes, modular tooling, multiple handles and stabilizers, a 1.5KHz motor response time, and 5degree-of-freedom thermal head scanning. The X-Y stage can accommodate a maximum of 3.2kg of material, while the multiple tooling feature ensures flexibility and quick tool changing. Sprint 4510 has an innovative, compact design which allows for automatic calibration and adjustment at the time of prototying. The device also has an automated Fault Analysis Machine that assists users in tracking and deciding what repairing or servicing may be required. Lastly, ACCULOGIC Sprint 4510 comes with easy-to-use programming software which supports the automation of complex probing and test applications.
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