Used ADVANCED INSTRUMENT TECHNOLOGY / AIT CMT-SR2000N #9231935 for sale

ID: 9231935
Vintage: 2001
Automatic system With options JANDEL 4-Point probe head unit Z-Axis robot arm Revolution sample stage chuck (XY Axis) Membrane keyboard panel LCD Display window Remote control communication port Vacuum hose connector (200 mm Hg) 2001 vintage.
ADVANCED INSTRUMENT TECHNOLOGY / AIT CMT-SR2000N is an innovative prober designed for semiconductor device testing. It is a state-of-the-art prober that delivers superior performance, reliability, and accuracy, making it ideal for the most demanding probing applications. AIT CMT-SR2000N features a new prober platform which offers a superior probing interface and higher accuracy. The platform combines an active compact prober body with an excellent alignment equipment in a compact package for fast and accurate probing. It is equipped with a computer controlled 8-axis robotic arm for precise x, y, θ, and z-axis motion. This advanced prober is capable of manipulating probes with a thickness up to 1.2 mm in the X-Y plane. ADVANCED INSTRUMENT TECHNOLOGY CMT-SR2000N supports the FOUP (Filled Open Unloader Prober) concept which helps to reduce unloading time and improve throughput. CMT-SR2000N also features an integrated camera-based optical recognition system for positioning and adjusting the probe tips. This allows for precise alignment and contact force setting during probing. The unit also supports the use of various interchangeable probing heads for different applications including singulated ICs, wafers, and bare die. ADVANCED INSTRUMENT TECHNOLOGY / AIT CMT-SR2000N is equipped with an integrated source meter for measuring DC electrical parameters during testing. The source meter has a high precision of 0.1 % and a frequency of up to 10 MHz. AIT CMT-SR2000N is also equipped with a powerful motion control machine for faster probing operations. The advanced motion control tool enables faster Operation speeds, up to 1 ms per cathodic contact. The asset also provides real-time monitoring of contact force and test parameters. ADVANCED INSTRUMENT TECHNOLOGY CMT-SR2000N is a fully-automated prober that can handle up to 30 parallel probing sites and 32 different test parameters. It is also equipped with an environmental test chamber for testing devices in wafer form. CMT-SR2000N is built to ensure reliable testing performance. It is designed with an advanced vibration isolation model for harsh environments and also provides strong electromagnetic compatibility characteristics. The equipment also comes with a range of easy-to-use software packages for programming, data logging, and troubleshooting. Overall, ADVANCED INSTRUMENT TECHNOLOGY / AIT CMT-SR2000N is a reliable and accurate prober that delivers superior performance in demanding applications. Its advanced features and capabilities make it a suitable choice for enhanced semiconductor device testing.
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