Used AGILENT / HP / HEWLETT-PACKARD / KEYSIGHT 1132A #9280476 for sale

AGILENT / HP / HEWLETT-PACKARD / KEYSIGHT 1132A prober is a powerful, versatile testing tool for performing probing and testing of electronic devices. Its unique design and features enable the reliable measurement of a wide variety of device parameters from DC up to over 100 GHz. HP 1132A prober comes equipped with an industry standard wafer chuck, a direct drive z-rotation mechanism, and a 3-axis manipulator arm with a nominal travel range up to 10 inch. It also provides a resolution of up to ±0.0001 inch in x-y coordinates and ±0.0001 inch in z height. AGILENT 1132A is capable of providing precise data measurements while keeping the package safe from damage. It has an auto wafer recognition feature which allows it to automatically secure and scan the device parameters as soon as it is placed on the chuck. This feature increases the testing efficiency and eliminates manual calculations. KEYSIGHT 1132A prober is equipped with a pin mapping system that accurately aligns the device's contacts to the probe tips with optimized flexibility and accuracy. This ensures the most accurate measurements while avoiding signal line collisions and contamination associated with out-of-plane contacts. 1132A prober is also capable of providing a large variety of visual inspection options including: Automatic Defect Detection (ADD), color video inspection, and high contrast live inspection. These features are designed to help quality assurance personnel identify potentially defective components quickly and accurately. HEWLETT-PACKARD 1132A prober is a powerful, versatile testing tool for performing a wide range of probing and testing applications. With its industry-standard wafer chuck, direct drive z-rotation mechanism, and 3-axis manipulator arm, this prober ensures accurate measurements and easy operation while protecting your devices from damage during testing. Its pin mapping system and inspection capabilities further increase the accuracy and efficiency of your testing.