Used APPLIED PRECISION / RUDOLPH probeWoRx 300 #9407124 for sale

APPLIED PRECISION / RUDOLPH probeWoRx 300 is a prober designed for the probing of advanced semiconductor circuits in production-level environments. This unique equipment stands out from other probing products on the market, as it specifically focuses on improving the speed and accuracy of probing without sacrificing the yield rate. This system provides both manual and automated probing capability, enabling operators to quickly and accurately move from one device to another. The core of this unit is its highly accurate flat field X-Y translation stage, enabling probes to be quickly and precisely positioned according to wafer type and device requirements. The integrated 300 mm quartz wafers are accurately aligned by computer-controlled galvanometer optics, establishing the perfect alignment before any probing takes place. An intuitive touchscreen interface allows easy navigation of the machine, while advanced motion controllers help maximize throughput. RUDOLPH probeWoRx 300 is equipped with a high resolution, LED-powered opti-touch head, which is designed to accurately measure the contact of the probe to the device. It is also capable of continuous, automated wafer alignment with a wide range of wafer sizes and substrates. The opti-touch head also provides high-resolution digital images for easy defect identification. Furthermore, this tool can accommodate up to four probes simultaneously, allowing for fast, simultaneous probing of multiple devices. With each probe accurately and individually tracked, APPLIED PRECISION probeWoRx 300 is able to provide accurate measurements across the entire device. Additionally, this asset includes a patented dual laser alignment model which helps maintain the highest levels of accuracy when probing. ProbeWoRx 300 is also equipped with a vision-corrected algorithm for fast and accurate alignment and device centering. This algorithm corrects any deviation in the vision positioning equipment and automatically orients the wafer in the correct position. Furthermore, it can detect any individual die that has moving or misaligned contacts, eliminating them from consideration. Overall, APPLIED PRECISION / RUDOLPH probeWoRx 300 prober is an advanced and robust probing system designed to provide users with a reliable and accurate way to identify and measure the electrical characteristics of semiconductor circuits. With its accurate X-Y translation stage and cutting-edge opti-touch head, this advanced prober is capable of delivering reliable and accurate measurements quickly and efficiently.