Used APPLIED PRECISION / RUDOLPH PRVX3 #9288120 for sale

APPLIED PRECISION / RUDOLPH PRVX3 is a prober that delivers both outstanding surface accuracy and unparalleled temperature stability for watt-level high power semiconductor device probing. RUDOLPH PRVX3 features a powered vertical stage, allowing it to place the probe as close as possible to the device under test. In addition, APPLIED PRECISION PRVX3's precision actuation system offers resistive linearity and thermal stability so that unknown factors such as thermal expansion or component vibration do not lead to incorrect measurements. When coupled with the right load-pull system, PRVX3 can be used to simultaneously measure two or more test parameters while controlling chamber temperature in the nanometer range. This ensures the accuracy and repeatability of the measurements. APPLIED PRECISION / RUDOLPH PRVX3 also features a wide range of probe types, including AC, DC, broadband, and differential capacitance. It can be used for a variety of probing applications, from S-parameter measurements to parameter-specific probing of active FETs, as well as for both power IC and DC measurements. RUDOLPH PRVX3 has a compact design, allowing it to fit in tight, often cramped testing spaces. The design also includes a thermal-controlled mounting for up to three chuck stages, and a closed-loop X-Y stage, which reduces thermal drift and achieves a stable probing height from station to station on each contact surface. In addition to its simple and effective operation, APPLIED PRECISION PRVX3 also offers advanced features. These advanced features include user configurable probe-shielding setups and multiple sensors for temperature and humidity control. The unit also features a high-end data logging system with direct access to the real-time data, allowing users to obtain instantaneous results when required. All-in-all, PRVX3 is a highly advanced and precise prober. It is well suited to applications requiring watt-level high power semiconductor device probing and enables the accurate and repeatable measurement of a variety of different test parameters.