Used CASCADE 12K #293813490 for sale
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ID: 293813490
Wafer Size: 8"
Semi-Automatic Probers (Sap), 8"
Ambient and hot thermal chucks
Hot and cold thermal chucks
A-Zoom optical microscope
Vibraplane vibration isolation table.
CASCAD CASCADE 12K is a highly advanced prober equipment designed for semiconductor testing and characterization applications. It is manufactured by CASCADE Microtech, a leading provider of advanced equipment for the semiconductor industry. 12K prober offers state-of-the-art technology, precision, performance, and flexibility to meet the demanding requirements of semiconductor device testing. CASCADE 12K prober features a high-precision Chuck with a large probing area, capable of handling wafers up to 12 inches in diameter. The Chuck provides excellent thermal stability and uniformity, ensuring accurate and reliable measurements during testing. The Chuck also allows for quick and easy loading and unloading of wafers, enhancing productivity in the testing process. The prober is equipped with advanced probing technologies, including MicroChamber technology, which provides controlled temperature and humidity conditions during testing. This ensures consistent and reliable measurements, particularly for sensitive devices that are susceptible to environmental factors. The MicroChamber technology also helps to minimize signal interference and improve the overall accuracy of test results. One of the key features of 12K is its high-precision nanopositioning system, which enables precise positioning of probes on the device under test. The nanopositioning unit offers sub-micron accuracy, allowing for fine adjustments and measurements at the nano-scale level. This level of precision is crucial for testing advanced semiconductor devices with tight tolerances and complex structures. CASCADE 12K prober also features a sophisticated automation machine that streamlines the testing process and improves efficiency. The tool is equipped with advanced software controls and algorithms that enable automated wafer mapping, probe calibration, and test execution. This automation capability reduces the need for manual intervention, minimizes human errors, and accelerates the overall testing throughput. In addition to its advanced technology and precision capabilities, 12K prober offers a high degree of flexibility to accommodate a wide range of testing scenarios. The prober supports multiple probing configurations, including single-site, multi-site, and full-wafer probing, allowing for versatile testing setups based on the specific requirements of the semiconductor device under test. CASCADE 12K prober also offers comprehensive data analysis and reporting capabilities to help semiconductor engineers interpret test results effectively. The prober's software interface provides detailed visualization tools, statistical analysis features, and customizable reporting templates to facilitate in-depth analysis of device performance and characteristics. Overall, 12K is a cutting-edge prober asset that combines advanced technology, precision, performance, and flexibility to address the evolving needs of semiconductor testing and characterization. With its high-precision Chuck, advanced probing technologies, nanopositioning model, automation capabilities, and comprehensive data analysis features, CASCADE 12K is a versatile and reliable solution for semiconductor engineers looking to achieve accurate and reliable test results for their advanced semiconductor devices.
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