Used CASCADE MICROTECH / ALESSI 12861 #9224552 for sale
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ID: 9224552
Prober
High stability bridge
MITUTOYO Microscope
Station controller
PC: Windows 7, Intel “I”
KINETIC SYSTEMS Vibraplane heavy duty air suspended anti-vibration table
Guarded thermal chuck: -55 to 200 Capable
With TEMPTRONIC TPO3000 thermal controller and chiller.
CASCADE MICROTECH / ALESSI 12861 is a mechanical prober designed for testing semiconductors at frequencies up to 13 GHz. It utilizes a unique patented design to ensure accuracy and repeatability in testing. ALESSI 12861 provides a combination of high power handling, wide probe bandwidth, exceptionally low contact resistance, and reliable performance for electrical characterization, fault identification, probing under temperature cycled conditions, and other specialized semiconductor tests. The prober features a 50-site, 10" x 10" linear array table, a patented vacuum alignment equipment, and a digital micrometer adjustment system for precise control of measurement point placement. It is equipped with a three-axis manual micrometer adjustment unit for faster, easier setup and integration into manual test systems. In addition, CASCADE MICROTECH 12861 utilizes a flexible, modular design to accommodate different probe cards and wafer kinds, as well as to provide the broadest range of probing capabilities. 12861 is a reliable solution for testing high frequency ICs, with a wide array of hardware options available. The mechanical design of this prober ensures that all probe points are aligned properly and exhibit low contact resistance. The 50-site, 10" x 10" linear array table, vacuum alignment machine, and digital micrometer adjustment provide exceptional repeatability and accuracy in testing. The three-axis manual micrometer adjustment tool enables faster, easier setup and integration into manual test systems, while its modular design allows for broadest range of probing capabilities. All of these features make CASCADE MICROTECH / ALESSI 12861 an ideal prober for the high frequency testing of ICs.
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