Used CASCADE MICROTECH / ALESSI CM 300-S #9357262 for sale

CASCADE MICROTECH / ALESSI CM 300-S is a probe station designed for wafer probing, module testing, and materials characterization. This probe station is equipped with a superior electrostatic planarity, enabling measurements to be made on samples with a very high degree of precision. It also has a five-axis control system that allows users to move and position a probe tip at a precise location on a device or wafer surface. ALESSI CM 300-S is a hot/cold temperature-controlled probe station with a working area of 380mm x 380mm. The station is capable of temperature control from -40°C to +175°C, allowing for superior thermal stability while conducting probing and investigations. A probe arm is available for rapid, precise sample positioning and device testing. The arm also provides a forward/backward tilt range of up to 45° and around rotation of up to 360°. The station is also equipped with a patented "tip-to-sample" alignment system for accurate placement of the probe tip in relation to the wafer surface. The probe station also features an electrically-isolated air-bearing design. This design eliminates problems caused by electrical coupling, such as noise, interference, and cross-talk, while providing superior laser-based alignment. Additionally, CASCADE MICROTECH CM 300-S is equipped with a selectable low-vacuum feature that allows measurements to be made on high-accuracy vacuum targets. This feature also provides superior stability when making measurements on samples coated with non-conductive materials. CM 300-S is equipped with a comprehensive set of software tools for controlling and monitoring probing and testing operations. This software provides real-time data collection and analysis for Acquire/Display/Analyze (ADA) type systems. A high-accuracy X-ray feature is included to ensure proper alignment of the probe on a wafer or device surface. This feature is also used for precise temperature control of a sample under test. Additionally, the system can test up to 24 devices at a time, making it suitable for multi-device projects. Overall, CASCADE MICROTECH / ALESSI CM 300-S is an advanced prober designed for wafer probing, module testing, and materials characterization that offers superior electrostatic planarity, five-axis control, temperature control, and enhanced software capabilities. Its advanced capabilities make it ideal for a wide range of laboratory applications.