Used CASCADE MICROTECH / ALESSI PA 300PS #9373219 for sale

ID: 9373219
Vintage: 2002
Probe system Semiautomatic F70 Scope 10X Objective lens PCL2000 TRIO TECH Thermal controller Temperature: 200°C to -50°C 2002 vintage.
CASCADE MICROTECH / ALESSI PA 300PS is an advanced prober developed for testing integrated circuits (ICs). This automated prober is designed with a 300 mm x 300 mm active area and a 300 mm vertical movement range. It features a low-profile design, allowing for easy and efficient setup and operation. ALESSI PA 300PS offers a high-precision DC/AC/RF prober with an extended height range. Its closed-loop design consists of independent servo-axes driven by microstep motors with electronic drag compensation for reliable performance at high speeds. With its precision alignment stage, CASCADE MICROTECH PA 300PS is capable of accommodating packages from 0.5 to 34 mm in diameter. This prober is also equipped with active temperature control for both pneumatic and thermal modules. Additionally, PA 300PS provides a recognizable, easily configurable test strategy combined with fast, high-speed test performance. The user can easily configure the software to their desired prober operation. Its user-friendly Graphical User Interface (GUI) includes a variety of standard icons for analysis and editing that are designed to maintain accuracy during the entire test process. CASCADE MICROTECH / ALESSI PA 300PS is engineered with features that optimize throughput and test accuracy. Its high-speed handlers offer quick loading and are capable of handling test sites with up to 1000 ICs per hour. The wide range of needles and probes allow for flexibility in probing capabilities and diverse test configurations. It also features an advanced high-accuracy vectorless test algorithm, which eliminates measurement inaccuracies caused by component and IC lead movement. ALESSI PA 300PS is a reliable and versatile tool for IC testing. Its compact size and variable tread radius makes it suitable for small, medium, and large scale applications. With its advanced prober design, users are able to generate accurate test results with increased throughput, at high speeds which makes it an ideal choice for production facilities that require precise and fast IC testing.
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