Used CASCADE MICROTECH / ALESSI PAC 200 #293642410 for sale

CASCADE MICROTECH / ALESSI PAC 200 is a high-performance prober designed to meet the stringent requirements of wafer-level testing. This state-of-the-art prober is able to simultaneously probe multiple layers of wafers at high speed and accuracy. It offers a wide range of testing capabilities including semiconductor, flip chip, multi-chip module (MCM), ceramic and printed circuit board (PCB) testing. The prober consists of the main system base module and various probing modules. The main prober base includes a power-assisted lift, motorized XY stage for precise location of the wafer chuck, a rotating spindle for precision wafer locating and several other components. The system can support up to 8 stepper motor driven probing cards and up to 16 modules including dual-probing heads, single actuation probes, change-over needles, electrically floating Omni tools and more. The prober is integrated with ALESSI application software, which provides a user-friendly graphical interface for setting up, powering and controlling the prober system. The software includes precision alignment, level calibration, speed definition, automatic focusing capabilities and a full range of diagnostics and test results for each probing step. Furthermore, the prober offers advanced control monitoring and data handling capabilities. With its closed loop DC servo motor technology and advanced control algorithms, the prober offers excellent accuracy and repeatability. Additionally, its onboard data handling capabilities include automatic sorting, grouping, averaging and statistical analysis of test data. The prober also includes a range of safety features such as ground connection monitoring, short circuit prevention, power failure protection and temperature control for optimal performance. With its advanced features, this prober is well-suited for volume testing and production.