Used CASCADE MICROTECH / ALESSI PS21 #9250784 for sale

CASCADE MICROTECH / ALESSI PS21 prober is a precision machine designed for wafer probing applications. It has a robust structure to provide reliable mechanical performance and low vibration, making it suitable for demanding production requirements. It is designed for semiconductor test and characterization, including wafer testing, FIB (focused ion beam), and wafer probing. ALESSI PS21 has the most advanced probe cards, electronics, and software for controlling wafer probing. The onboard computer is powered by Windows 10, with web control over Ethernet to access all the features of the prober. The equipment can program up to 32 PCM of high-speed probing, with a maximum measurement speed of 4kHz. The flexible configuration options enable custom applications and can be used for a wide range of technologies, including Si, GaAs, and RF/uW. CASCADE MICROTECH PS21 has an advanced vacuum chucking system and a high-magnification optical unit for submicron probing. The automated wafer loading and unloading machine helps reduce human operator errors and labor costs, and can handle up to eight wafers at a time. The X,Y,Θ motions of the stage are driven by closed-loop low-inertia servo linear motors. The stage accuracy is ±25 micrometers and the resolution is 0.1μm. PS21 prober is equipped with a high-precision auto-scaling stage and wafer alignment optics to ensure precise alignment and optimize performance. The tool offers high-speed scanning and measuring capabilities to quickly capture data, along with integrated thermal management to ensure accuracy and reliability at all times. The onboard software provides an automated workflow, and integrates with industry standard wafer prober controllers (LCC, G&W, Open Prober) for streamlined testing operations. It also offers a wide range of advanced features, such as test recipe development, feedback analysis, data logging, and alarms. CASCADE MICROTECH / ALESSI PS21 is a highly reliable and versatile wafer testing prober designed to meet the most demanding production requirements. The flexible configurations allow for a wide range of applications, from semiconductor test/characterization to FIB/probe testing, and the automated workflow increases testing speed and accuracy. The integrated thermal management and advanced control features ensure maximum reliability and performance.