Used CASCADE MICROTECH / ALESSI REL 3200 #9058348 for sale

CASCADE MICROTECH / ALESSI REL 3200 is a powerful computerized prober that is designed to test both semiconductor and MEMS devices, as well as smart sensors and displays. With its combination of high-precision metrology, a suite of custom-designed probes, and software-defined scanning capabilities, ALESSI REL 3200 can reach down to the nanometer level to characterize a microstructure, as well as multiple materials such as silicon, organic PCBs, and gallium arsenide. At its core, CASCADE MICROTECH REL 3200 is a low-force prober, which is capable of creating extremely high resolution scans of the contact pads of integrated circuits with a minimum of disruption to the circuitry. It's designed to precisely move its tips along a rounded path, while maintaining contact with the DUT. This allows for accurate data collection over traditional C-V (capacitance-voltage) measurements. Software-defined scanning capabilities make REL 3200 one of the most versatile probers on the market. Pre-defined non-circular scanning paths are available for basic and complex characterization runs, while also allowing the user to create their own customized scan paths for specific types of tests. A touch detection algorithm allows CASCADE MICROTECH / ALESSI REL 3200 to perform repeatable and precise scanning in both 2 and 3 dimensions. In addition, ALESSI REL 3200 is also built with a variety of probe tips designed to safely interact with delicate components. Its low-force cantilever probes are ideal for making measurements on delicate DUTs with low levels of mechanical tearing, while its vertical and horizontal probes provide a level of stiffness that is necessary for increasing the amount of force that can be applied in a controlled manner. The user-friendly, intuitive software interface makes it easy to program and access the test parameters stored in the system. Data is conveniently stored on USB drives, which simplifies data management and archival. Additionally, the system's automated self-calibration routine minimizes alignment times for high-throughput production environments. Overall, the safety, reliability, and accuracy features of CASCADE MICROTECH REL 3200 make it an ideal prober for a variety of semiconductor applications. Its combination of low-force probing, non-circular scanning patterns, intuitive software, and interchangeable probe tips ensure that the data that it collects is of the highest quality.