Used CASCADE MICROTECH / ALESSI REL 4100A #293634227 for sale

CASCADE MICROTECH / ALESSI REL 4100A is an advanced prober designed for testing, analyzing and validating integrated circuits. The system is equipped with a range of options to suit the specific test and analysis requirements of different applications. It features a high-performance , scanning pattern generator that can generate up to four channels of data and is capable of testing wafers with up to 100 pads per device. The scan speed and pause intervals can be adjusted to suit specific test sequences and other advanced trapping and masking options are available. The prober includes a five-axis robotic arm with a vacuum Pick & Place system to transfer devices to the test heads. The system features a four-point precision contact mechanism to ensure precise and accurate contact during testing. The prober's safety features are designed to protect operators and devices. Other features include pattern edit, data acquisition and control of digital I/O devices. The use of this prober provides increased test speed and accuracy, simplifying testing and analysis. Test results can be compared quickly, allowing for a more efficient validation process. The prober offers improved flexibility and functionality, enabling it to be used in a range of applications. Additionally, ALESSI REL 4100A is easily upgradeable and compatible with other high-end test solutions. The prober is easy to use and configure, offering a comprehensive set of control and diagnostic applications. It is also equipped with integrated safety and fail-safe systems and has the capability to be remotely monitored and troubleshot from any location. The prober is available in both benchtop and tabletop sizes, and can be easily integrated into existing semiconductor fabs and laboratories. CASCADE MICROTECH REL 4100A is an ideal choice for testing, analyzing and validating integrated circuits. Its advanced features and easy-to-use diagnostic applications provide tailored test solutions, allowing for a higher level of testing speed and accuracy. Furthermore, it is reliable, cost effective and can be easily integrated into existing semiconductor fabs and laboratories.