Used CASCADE MICROTECH / ALESSI REL 4100A #9360457 for sale

CASCADE MICROTECH / ALESSI REL 4100A Prober is an advanced wafer probing and die testing equipment designed to meet the challenging requirements of the semiconductor manufacturing industry. The system is based on a modular platform, enabling multiple configurable test capabilities. It is designed to deliver high throughput and fast data acquisition, while also providing the flexibility to support a variety of wafer testing requirements. The unit utilizes an ultra-high throughput architecture with a digital signal processor (DSP) and programmable logic devices (PLDs). This enables the machine to acquire test data quickly and accurately to provide faster testing results. ALESSI REL 4100A Prober is also designed with a customer-defined multi-well contactor, allowing operators to select from a range of probe card designs. This allows the tool to efficiently test wafers of different dimensions. The asset is also equipped with a high speed auto-focus optical microscope that provides excellent images of wafers under test. The high resolution color images enable operators to accurately measure features on the surfaces of wafers. This is particularly useful for analyzing surface contours during die test and failure analysis. Other features of CASCADE MICROTECH REL 4100A Prober include auto-alignment capabilities, which enable the automatic alignment of wafer under test before probing. The model can also be used with a range of probing media, including liquid crystal (LT) dielectric liquid (DIL), standard as well as self-shielding probes. This allows the equipment to handle a range of different wafer probing applications. The user-friendly, intuitive graphical user interface allows users to set up and configure the system quickly. This enables operators to easily capture all probe geometry parameters like X, Y, and Z offsets, contact pressure, and traverse speed. The GUI also provides real-time feedback and control over the start and end points of the measurement cycle. REL 4100A Prober is a powerful and multi-function wafer probing and die testing solution that has been designed and built to meet the most demanding requirements of the semiconductor industry. The unit features a modular platform that enables quick configuration and setup for efficient testing of wafer-level components. The machine provides fast data acquisition and excellent imaging capabilities for accurate testing of wafer features. The intuitive graphical user interface makes setup and configuration for various applications easy and efficient.