Used CASCADE MICROTECH / ALESSI REL 4300 #9119307 for sale

CASCADE MICROTECH / ALESSI REL 4300 is a prober designed for automatic wafer testing. The prober is ideal for testing wafer semiconductor devices such as logic or memory. It includes a fully automated handling equipment and has easy programmable capabilities. The prober is equipped with a variety of electrical measurement tools and is able to measure test results with high accuracy and repeatability. ALESSI REL 4300 is composed of several components, including a mainframe, a wafer handler, and a multifunctional electric characterization system (EMCS). The mainframe houses the wafer handler and EMCS, while the wafer handler can transport wafers to the desired probe station. The EMCS includes a variety of electrical measurements such as temperature, voltage, phase, frequency, and current. In addition, the prober also comes with a wafer alignment unit and a software loading machine. The prober is also fully automated, meaning that it can run a series of tests with minimal user interaction. It is capable of being programmed to complete complex procedures with a wide range of settings. Additionally, the prober is equipped with an audit process to ensure accuracy and repeatability, which is enabled through the use of various software tools such as multi-dimensional characterization, statistical analysis, and product processing. In terms of testing capabilities, CASCADE MICROTECH REL 4300 prober has the capacity to test multiple wafer locations in a single session. It can test up to a maximum of 100 wafer sites per session, with a test accuracy of 0.25 microns. Furthermore, with its programmable capabilities, the prober can perform simultaneous measurements and testing on multiple sites. The testing procedure also includes a calibrated threshold voltage and depth profiling, and can integrate with various test platforms. Overall, REL 4300 prober is a versatile and reliable testing solution for wafer semiconductor devices. Its automated handling and programmable capabilities, combined with its wide range of electrical measurements, make it ideal for a variety of applications. In addition, its ability to test multiple sites per session allows for quick and accurate results, making it a great solution for any automated wafer testing needs.