Used CASCADE MICROTECH / ALESSI REL 4500 #77977 for sale

CASCADE MICROTECH / ALESSI REL 4500 wafer prober provides a robust and reliable platform for automated testing and probing of semiconductor devices with a wide variety of probing technologies and applications. ALESSI REL 4500 prober provides a wide range of features and capabilities that enable the efficient and accurate testing and probing of a variety of devices, ranging from small devices to full wafer scale devices. The prober has the ability to handle wafers up to 18" and offers a variety of prober stages in addition to the standard inline prober stage. The prober has a solid state, non-contact, non-intrusive design, with a high speed electrical interface and a built-in vacuum system. CASCADE MICROTECH REL 4500 prober also features various mounting and vacuum systems that are designed to provide a stable environment to your test system. It includes contact probe modules, image modules, and temperature compensation modules. The contact probe modules utilize adjustable tip height, fast actuation response, secure probe connection, and low contact force measurements. The image modules provide a wide range of imaging solutions, including the ability to take photos, measure dimensions, and compare performance between different devices. The temperature compensation modules help with reducing thermal drift and provide a consistent temperature environment for accurate results. The prober also supports multiple motion systems for faster and more accurate testing. The motion systems include an auto-centering actuator, an auto-registration feature and a rotary driver. The prober features a user friendly control interface, allowing for easy setup and operation. A variety of software tools are provided with the system, allowing for automated testing, data collection, and analysis. The software provides various features such as multi-point data collection, automated plot annotation, and advanced data analysis. CASCADE MICROTECH / ALESSI REL 4500 prober is designed to provide a reliable, robust, and high performance platform for automated testing, probing, and analysis of many types of semiconductor devices. Its features and capabilities make it an ideal choice for efficient and accurate testing in many production, engineering, scientific, and research applications.