Used CASCADE MICROTECH / ALESSI REL 4500 #9096398 for sale

ID: 9096398
Probe station, Microzoom optics Color camera with cross hair and monitor.
CASCADE MICROTECH / ALESSI REL 4500 is an integrated solution for probing ICs on wafer and package devices in a variety of different applications. This prober is a complete wafer or Package-On-Package (POP) prober, consisting of a Cassetteless Mapper/Handler base station, a 5-axis wafer/packaging prober, an in-situ non-contact electro-optical inspection equipment, and an optional vision-guided pick & place tooling. The base station includes a threadable heated chuck and an elevator which provide access to eight individual cassettes, allowing the user to easily change cassettes and/or probe cards without compromising any system parameters. The unit is also equipped with an improved wafer mapping machine for accurate registration of wafers. Additionally, the software is designed to ensure continuous and uninterrupted probing, thus reducing overall test time. The 5-axis prober enables probing of a wide range of IC packages, from the small BGA to larger components such as QFNs. It also uses a new digital closed-loop force detection tool, removing the need to calibrate and adjust each probing head. With its fast and accurate probe motions, this asset enables accurate probing of ICs in 0.2 seconds or less. The model also automatically identifies and measures the misalignment of die, reducing both operator load and time. The in-situ non-contact electro-optical inspection equipment integrated with the system detects open-shorts, opens, and bridging of discrete components. Utilizing a beam scanning unit, the prober provides real-time inspection of chip-to-chip, chip-to-package ICs, and provides a detailed view of the die. The data collected by this machine can be used by a team of engineers to quickly detect potential reliability issues and detect potential reliability issues with a fidelity superior to that of a purely electrical tool. The optional vision-guided pick & place tooling further enhances the prober's performance by robotically and accurately positioningcomponents for testing. This asset is designed to enable high accuracy and high repeatability of the placement operations and minimize human error. With this model, users can shorten setup time, expand process scope, and minimize manual labor. In summary, ALESSI REL 4500 is an integrated wafer or Package-on-Package prober equipment, incorporating a cassetteless Mapper/handler base station, a 5-axis wafer/package prober, an in-situ non-contact electro-optical inspection system, and an optional vision-guided pick & place tooling unit. This robust tool is ideal for manufacturers looking to improve their speed, accuracy, and efficiency in testing ICs.
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