Used CASCADE MICROTECH / ALESSI REL 4800 #293615733 for sale

CASCADE MICROTECH / ALESSI REL 4800 is a high-performance, 4-axis Probe Equipment used for testing and characterization of semiconductor devices up to 150mm in size. This prober is especially capable of scanning and characterizing the latest generation of Contactless Memory Devices and the next-generation of Memory Structures. Using high-precision XYZ Autocalibration functionality, ALESSI REL 4800 performs highly accurate and automated probing of packages and wafers, reducing the time and labor needed to manually align wafers, packages and test structures. The advanced vector linear motors in CASCADE MICROTECH REL 4800 system also provide features such as high accuracy and repeatability, excellent dynamic performance and fast acceleration. The high-speed X and Y axes offer a speed up to 500 mHz and an accelerations up to 4.5G in combination with the Z axis, which provides speeds up to 1.2m/s and accelerations up to 8.0G. The probe arm of REL 4800 is a highly flexible unit, enabling fast and automated probe card exchange and exchangeable probe cards. It supports various types of probes, such as: active, passive and multi-test probe tips for simultaneous wafer testing, as well as contact points for non-contact probes to reduce voltage probe drift. The CMM Probe users are able to select the appropriate beam size, probe design, flexibility and frequency response for best results. CASCADE MICROTECH / ALESSI REL 4800 also comes with a full accessories package including an optically based camera-enabled laser alignment unit, an advanced force-sensitive floating head metrology machine and probe optimization software. This tool provides higher resolution measurements and greater consistency of data throughout the probe's lifetime, while offering superior throughput with quick setup times and zero calibration time. Overall, ALESSI REL 4800 is an advanced prober asset that enables highly efficient testing and characterization of semiconductor devices. It provides a fast and reliable testing environment for semiconductor engineers and manufacturers, resulting in higher-precision testing and reduced time and labor costs.